SAM 300
Scanning Acoustic Microscope
SAM System
General Specification Document ( 2012)PVA SAM 300
SAM 300 is a dedicated non destructive tool for quality and process control, as well as research applications. It enables detailed acoustic investigations through new RF and transducer technologies of up to 400MHz. A graphical user interface ensures that the powerful functionality of SAM 300 is easily applied. Modular concept and product platform on SAM 300 and reduce cost of ownership.
Built to industry standards around a core platform that utilizes the latest production and research technology, the SAM 300 can accurately handle samples up to 320 x 320 x 100 mm (w/l/h). It has an ultrasound frequency range up to 500 MHz with transducers from 5 - 400MHz.
Technical Specification
Mechanics Drive:
Scanning range:
Max. scanning speed: Acceleration: Repeatability: Encoder interface: Z-Drive:
Electronics RF-Interface: Signal Converter: Gain: Computer Control: Trigger Interface:
Image Resolution:
Multi-channel:
Water tank |
2 axis high speed linear motor system with inertia balance shockproof scanner Min. 250 x 250 μm ( Axis X-Y ) Max. 320 x 320 mm (Axis X-Y)
1500 mm/s 15 m/s2 ± 0.1 μm ( Axis X-Y ) 15 nm resolution Motorized, 100 mm travel range, encoder interface step ±2 nm
500MHz A/C interface 500 M sample / 1 G Sample > 120 dB with 0.5 dB step adjust High performance PC RAID 1, windows based Time resolution min.: 0.01 μs max.: 1.00 μs Min.: 125 x 125 pixel Max.: 32,000 x 32,000 pixel More than 100 channels to create different layer C-scan image
690 x 560 x 150 mm and could be customized by request |
PVA TePla Analytical Systems GmbH Deutschordenstrasse 38 D-73463 Westhausen, Germany | Phone: Fax: Email: Home: | +49 (0) 7363 9544 0 +49 (0) 7363 9544 -113 saminfo@pvatepla.com www.pva-analyticalsystems.com |
Technical Specification
Main Scanning Mode A-scan:
B-scan: P-scan: C-scan: X-scan: G-scan: Time-scan: 3D-scan: S-scan: Auto-scan:
Depth measurement:
Impedance polarity detection:
Transducer Lower frequency transducer: Middle & High frequency transducer:
Transducer diameter: Transmission receiver: Transmission emitter:
Analysis Software
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Point to Point scanning mode, with multi-display window or two echo waves display in one window for compare. Vertical scanning mode (cross section) Multi-vertical layer scanning mode Transverse scanning mode Auto multi - transverse scanning mode Manual multi - transverse scanning mode Hypostatic substance scanning mode 3D scanning mode Simultaneous Transmission and Reflection scanning mode Automatic focus, scanning area and gain selection, automatically focus in any layer, automatically setting parameters Automatic measurement depth and polarity layer by layer with A-scan and B-scan Simultaneous measurement and display impedance and polarity of sample
5 MHz- 400MHz available Piezoelectricity crystal material for low frequency transducers Piezoelectricity crystal film material for middle & high frequency transducers with delay diamond.
Min.: 14 mm, Max: 35 mm Min.: 10MHz, Max: 35MHz Min.: 5MHz, Max: 400MHz
English and Chinese version available Variable gain, gate width and gate delay setting during scanning, multiple gate setting run time filter, thresholding, positive-negative peak phase detection, amplitude, mean, bipolar, time of flight,. Phase measurement with automatic delamination detection. length measurement, zoom mode, auto area measurement, color coding. Picture reset function for easy reconstruction of PVA-SAM images, automatic storage of instrument setting. Impedance measurement with histogram and calibration curve, automatic acoustic impedance color set up, dedicated filter functions for SAM analysis. Analysis software included cavity and void defects calculation, statistics, classify, size, distribution in percent, content, max. or any defects size, etc. |
