SANTEC高性能可調(diào)諧激光器TSL-550
[可調(diào)波長(zhǎng)范圍] | 1260-1360/1500-1630nm |
[波長(zhǎng)分辨率] | 5pm or 1pm |
[波長(zhǎng)穩(wěn)定度] | ≤±5pm or ≤±1pm |
[輸出功率] | ≥+13(Peak);≥+10(Full range) |
[功率穩(wěn)定度] | ±0.01dB |
一款高性能可調(diào)諧激光器,擁有寬調(diào)諧范圍,高功率及高信噪比輸出. 無(wú)跳模調(diào)諧的TSL-550具有細(xì)調(diào)諧和相干控制的特性, 使得它成為精密光學(xué)測(cè)量的必備工具. SANTEC采用了創(chuàng)新的腔體設(shè)計(jì)以降低光的自發(fā)輻射噪聲, 這樣能獲得超過(guò)90dB/0.1nm的優(yōu)異信噪比, 并且同時(shí)可維持超過(guò)+10dBm的輸出功率. 支持工業(yè)標(biāo)準(zhǔn)SCPI命令集的GPIB和USB接口使得自動(dòng)測(cè)試解決方案更為便利.
TSL-550采用了外部諧振器,既滿(mǎn)足90 dB / 0.1 nm或更高的*信噪比,又滿(mǎn)足+10 dBm或更高的高輸出。具備微調(diào)控制和相干控制等功能,是進(jìn)行精que特性評(píng)估的*的工具。通過(guò)組合
多端口功率計(jì)MPM系列,偏振控制器PCU-100和軟件,可以進(jìn)行光學(xué)特性評(píng)估(IL,WDL,PDL)。有關(guān)光學(xué)表征系統(tǒng)的更多信息,請(qǐng)參見(jiàn)掃描測(cè)試系統(tǒng)。
特性
大光輸出:+13 dBm
高信噪比:90 dB / 0.1 nm
高波長(zhǎng)精度:-類(lèi)型
A:標(biāo)準(zhǔn)型號(hào)±20
pm-類(lèi)型C:高精度型號(hào)±5 pm
1260-1680 nm的寬帶波長(zhǎng)范圍
-O波段1260至1360 nm
--ES波段1355至1485 nm
--SCL波段1480至1630 nm
--CL波段1500至1630 nm
--U波段1560至1680 nm
日本santec實(shí)現(xiàn)高光輸出的可變波長(zhǎng)光源TSL-550
運(yùn)用
光學(xué)組件,模塊評(píng)估-
波長(zhǎng)選擇開(kāi)關(guān)(WSS),AWG,波長(zhǎng)阻擋器
-DWDM組件
光子器件/微腔諧振器評(píng)估
The TSL-550 is a high performance tunable laser with a wide tuning range and an output combining high power and high signal-to-noise ratio. The mod-hop-free tuning TSL-550 is equipped with features such as fine tuning and coherence control making it a must have tool for precision optical testing. Santec has used an innovative cavity design to lower the optical ASE noise, resulting in an extraordinarily high signal-to-noise ratio of over 90dB/0.1nm, while also maintaining a high output power of over +10dBm. GPIB and USB interfaces with the industry standard SCPI command set provide a convenient automated measurement solution.
The TSL-550 has two separate versions: Type A includes a wavelength meter with ±20pm wavelength accuracy and Type C, the high accuracy version, with an absolute wavelength accuracy of ±5pm.
The TSL-550 is ideal for next generation components testing driven by innovations in Dense Wavelength Division Multiplexing (DWDM), passives and Wavelength Selective Switches (WSS) that require characterization of multi-input, high extinction ratio devices. The TSL-550 is designed to improve production inspection throughput by doubling the scan repetition rate over conventional lasers. In addition, the TSL-550 is available for WDL and PDL measurement with the support of our power meter, MPM-200 and dedicated software
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